Atomic Force Microscopy (AFM) is used in our lab to mainly get the topography images of QD or other nanoparticles. The AFM tip can be modified to manipulate – pickup, push, pull nanoparticles. Often fluorescence and AFM measurements are done simultaneously or subsequently to get get the fluorescence and topography images.
Selected Publications
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Liu, Z., Ricks, A. M., Wang, H., Song, N., Fan, F., Zou, S., & Lian, T. High-Resolution Imaging of Electric Field Enhancement and Energy-Transfer Quenching by a Single Silver Nanowire Using QD-Modified AFM Tips. J. Phys. Chem. Lett., 2013, 4, 2284-2291. |
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Liu, Z., Zhu, H., Song, N., & Lian, T. Probing Spatially Dependent PhotoinducedCharge Transfer Dynamics to TiO2 Nanoparticles Using Single Quantum Dot Modified Atomic Force Microscopy Tips. Nano Lett, 2013,13, 5563-5569. |
Other Research Fields
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Transient absorption/reflection spectroscopy (in visible and IR |
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